X-ray reflectivity measurements on Cd-arachidat films
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Simultaneous in situ measurements of x-ray reflectivity and optical spectroscopy during organic semiconductor thin film growth
Simultaneous in situ real-time measurements of x-ray reflectivity and differential reflectance spectroscopy were conducted during deposition of perfluorinated copper-phthalocyanine thin films on SiO2 /Si. We found a continuous spectral change coinciding with structural changes from submonolayer coverage, to standing bilayer-phase and to -phase for thicker films. This combined measurement enable...
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